Product	Description	Applications
Nano-Cyte®LC	3D image-based stability for live cell imaging	microscope focus drift correction for super-resolution (sr) microscopy, live cell imaging, single molecule microscopy
RM21™ Microscope Platform	Precision aligned microscope platform	optical microscopy, super-resolution (SR) microscopy, live cell imaging, single molecule microscopy and spectroscopy
Cyto-Lite™	Multi-wavelength laser engine	optical microscopy, super-resolution (SR) microscopy, live cell imaging, single molecule microscopy and spectroscopy
C-Focus™	Automatic microscope focus drift correction	microscope focus correction, high speed confocal imaging
Nano-View® Series	Fully integrated nanopositioning and micropositioning systems for use with inverted optical microscopes, combined with a high resolution, 2-axis or 3-axis nanopositioner	confocal and fluorescence imaging, single molecule microscopy and spectroscopy, particle tracking, optical trapping, optical tweezers, super resolution (SR) microscopy
Nano-View®/M	Fully integrated nanopositioning and micropositioning systems for use with inverted optical microscopes, combined with a high resolution, 2-axis or 3-axis nanopositioner	confocal and fluorescence imaging, single molecule microscopy and spectroscopy, particle tracking, optical trapping, optical tweezers, super resolution (SR) microscopy

Product	Description	Applications
SPM-M Kit	High resolution, closed loop, scanning resonant probe microscope	nanoscale characterization, nanoscale fabrication, optical antennas, nano-optics, semiconductors, data storage, and more
MadPLL®	Fully integrated instrument package that allows the user to create a low cost, closed loop, "instant" AFM or NSOM	AFM and NSOM
Tuning Forks	Quartz crystal tuning forks, fully compatible with the MadPLL® instrument package	scanning probe microscopy, atomic force microscopy (AFM), near-field scanning optical microscopy (NSOM)

Product	Description	Applications
Nano-Gauge™ Series	Ultra-high precision, single axis, displacement measuring devices	metrology, alignment, nanopositioner calibration, transducer calibration, position creep measurements

Nearly all standard systems can be modified for vacuum applications to 10-8 Torr if baking is not necessary. Many UHV applications require custom designed solutions. With experienced UHV instrumentation specialists on staff, we can provide custom nanopositioning solutions. For design guidance see our custom page or contact our vacuum specialists.

Product	Description	Axes	Applications
Nano-UHV50	Ultra High Vacuum (UHV) compatible nanopositioner with 50 µm range of motion in X and Y, can be baked at temperatures up to 100° C	2	X-ray, VUV, and optical microscopy, UHV AFM, wafer testing
Nano-UHV100	Ultra High Vacuum (UHV) compatible nanopositioner with 100 µm range of motion in X and Y, can be baked at temperatures up to 100° C	2	X-ray, VUV, and optical microscopy, UHV AFM, wafer testing
Nano-UHV200	Ultra High Vacuum (UHV) compatible sub-nanometer precision scanner with 200 µm range of motion in X, Y and Z, can be baked at temperatures up to 100° C.	3	X-ray, VUV, and optical microscopy, UHV AFM, wafer testing