Nano-View®/M Series
Drawing (2 Axis)
Drawing (3 Axis)
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Features
Manual micropositioning with nanopositioning
1" (25mm) 2-axis coarse positioning
2-axis or 3-axis nanopositioning
Large aperture
Retrofit to inverted microscopes
Closed loop control
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Typical Applications
Optical microscopy, easy to retrofit
Confocal imaging
Fluorescence imaging
Single molecule spectroscopy
Particle tracking
Nanomanipulation
STORM and PALM imaging
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Product Description |
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The Nano-View®/M is a fully integrated positioning system for use with inverted optical microscopes. Easy to operate and affordable, the Nano-View/M® combines a manual micrometer driven, two axis, linear motion stage with high resolution, long range nanopositioners - either ultra-low profile or ultra-high speed. A stable blocking force of 10 N built into each axis of the coarse positioning stage provides a secure base for precision nanopositioning. The nanopositioning systems built into the Nano-View®/M have the lowest profiles available and provide sub-nanometer resolution under closed loop control. The overall height of the Nano-View®/M with the low profile nanopositioners is only slightly more than standard manual XY stages. An optional breadboard assembly with threaded mounting holes (1/4-20 on a 1 inch pattern or M6 on a 25mm pattern) is a convenient mounting surface for probes. Nanopositioner ranges of motion extend up to 300 microns per axis (X,Y and Z). Internal position sensors utilizing proprietary PicoQ® technology provide absolute, repeatable position measurement. The Nano-View®/M system includes the Nano-Drive® controller and is compatible with user written LabVIEW software. Standard Nano-View®/M systems are offered for the following inverted microscopes: Olympus IX/IX2 Series, Nikon TE2000/Ti Series, Leica DMI Series, and Zeiss Axiovert/Axio Observer Series. Nano-View®/M systems designed to fit other setups, including direct mounting to optical tables, may also be requested. Additional information regarding the built in nanopositioning systems can be found on the on the Nano-LPS Series, Nano-BioS Series, Nano-PDQ Series and Nano-LPQ pages. For extended XY motion (to 50mm) combined with a design that allows microscope objective nosepiece rotation and is also compatible with Mad City Labs nanopositioners, see the Manual MicroStage-LT Series. For Olympus upright BX microscopes, see the Manual MicroStage-BX, which is also compatible with Mad City Labs nanopositioning systems. Compatible Software Packages:      |
Technical Specifications - Low Profile Nanopositioners |
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| Axes of motion | XY or XYZ |
| Ranges of motion (XY or XYZ) |
100/200/300 μm |
| Resolution (100/200/300 μm) | 0.2/0.4/0.6 nm |
| Resonant Frequencies | |
| X axis (100/200/300 μm) | 400/350/300 Hz ±20% |
| Y axis (100/200/300 μm) | 400/350/300 Hz ±20% |
| Z axis (100/200/300 μm) | 400/300/200 Hz ±20% |
| Stiffness | 1.0 N/μm |
| θ roll, θ pitch (typical) | ≤1 μrad |
| θ yaw (typical) | ≤3 μrad |
| Recommended max. load (horizontal)* | 0.5 kg |
| Body Material | Al, Invar or Titanium |
| Controller | Nano-Drive® |
| * Larger load requirements should be discussed with our engineering staff. | |
Technical Specifications - High Speed Nanopositioners |
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| Axes of motion | XYZ |
| Range of motion (XY) |
75 μm |
| Ranges\ of motion (Z) | 50 μm |
| Resolution (50/75 μm) | 0.2/0.2/0.1 nm |
| Resonant Frequency (X, Y, and Z) | 1000 Hz ±20% |
| Stiffness | 1.0 N/μm |
| θ roll, θ pitch (typical) | ≤1 μrad |
| θ yaw (typical) | ≤3 μrad |
| Recommended max. load (horizontal)* | 100 g |
| Recommended max. load (vertical)* | 100 g |
| Body Material | Al, Invar or Titanium |
| Controller | Nano-Drive®85 |
| * Larger load requirements should be discussed with our engineering staff. | |
Technical Specifications - Micropositioning Stage |
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| Axes of motion | XY |
| Ranges of motion (XY) |
25mm |
| Graduations | 10 μm |
| Vernier graduations | 1 μm |
| Body Material | Aluminum |
Additional Information | |
Nano-View®/M (2-Axis) Drawing Nano-View®/M (3-Axis) Drawing  |
Nano-View®/M Series Catalog Pages |
Copyright © 2011