MadPLL^® is a powerful instrument package that allows the user to create an inexpensive, high resolution resonant scanning probe microscope using Mad City Labs nanopositioning systems. In short, MadPLL^® can be used to create an “instant” closed loop AFM or NSOM at a fraction of the cost of commercial systems. MadPLL^® is suitable for nanoscale characterization and nanoscale fabrication applications such as optical antennas, nano-optics, semiconductors, data storage, and more.

MadPLL^® has been specifically designed for resonant probes such as tuning forks and Akiyama probes. In addition MadPLL^® is fully compatible with Mad City Labs’ high resolution nanopositioning systems which makes it easy for users to build a scanning probe microscope with a flexibility that cannot be achieved with other commercial systems.

The seamless integration of hardware combined with the built-in automated control of MadPLL^® means that you can concentrate on getting results, not tweaking parameters.

MadPLL^® is ideal for research and teaching laboratories offering high performance, versatility, simplicity and excellent value.

Features Low cost Software, PLL controller, sensor amplifier, and probe boards included Easy and flexible configuration Fully self contained - no external signals required Automated software control

Auto PCC control Auto Q Calculation, resonant frequency detection Integrated Z axis PI control loop Fully compatible with Mad City Labs positioning products

MadPLL^® is an integrated solution that includes the digital phase lock loop (PLL) controller, software, sensor amplifier board and resonant probe mounting board. Simply add your Akiyama probe or tuning fork to the probe board to create a powerful force sensor for scanning probe measurements.

The MadPLL® package includes the MadPLL® digital PLL controller, sensor board, probe board, and MadPLL® software. Ease of integration with resonant probes and Mad City Labs' low noise nanopositioning systems give users the ability to create high performance, low cost NSOM and AFM instruments.

The PLL controller contains a digitally controlled proportional integral (PI) loop designed to work seamlessly with Mad City Labs’ nanopositioning systems. The addition of closed loop nanopositioners adds to the high performance of MadPLL^®. Additional options are available for multi-axis closed loop nanopositioning control. Mad City Labs' nanopositioning systems have integrated PicoQ^® sensors for absolute positioning. These PicoQ^® sensors are installed in every Mad City Labs nanopositioning system and can be used to provide a position signal that is free from hysteresis and creep to the MadPLL for imaging.

The PLL controller has three operational modes: self oscillation, PLL driven, and (lock-in) DDS driven. The probe can be controlled in constant excitation or constant signal mode. Measured outputs from the controller include changes in frequency, amplitude or phase shift.

The digital MadPLL® controller has three operational modes: self oscillation, PLL driven, and DDS driven. The probe can be controlled in constant excitation amplitude or constant signal amplitude. Changes in frequency, amplitude, or phase are measured for Z control.

The sensor amplifier and probe board assemblies are compact and can be fitted to existing instrumentation. The probe board simply plugs into the sensor amplifier board. The sensor amplifier board can be mounted to a precision positioner such as a closed loop nanopositioning system. The probe board has been designed for use with tuning forks and Akiyama probes. These probes are easy to mount and alignment free.

MadPLL® includes a sensor amplifier board and probe boards. The probe boards are designed for use with tuning forks, Akiyama probes and Accutune probes.

MadPLL^® simplifies the control of your scanning probe microscope. Many of the functions of MadPLL^® are fully automated - no front panel knobs or pots to adjust! The flexible and user friendly MadPLL^® software allows complete control of user adjustable parameters. Among the software features are automated setup, configuration control, auto Q calculation and automatic parasitic capacitance compensation (PCC) control. These included features are designed to simplify setup and accelerate the data acquisition process.

Instant AFM - just add science!

MadPLL^® can be used to create a customized, high resolution atomic force microscope (AFM) at a fraction of the cost of commercial systems. MadPLL^® has been designed to directly interface with Mad City Labs’ low noise single and multi-axis nanopositioning systems, making it possible to create a fully closed loop AFM. The AFM described is suitable for both research and teaching environments and can be further customized for vacuum operation. MadPLL^® is suitable for nanoscale characterization and nanoscale fabrication applications such as optical antennas, nano-optics, semiconductors, data storage, and more.

Mad City Labs AFM Assembly Tutorial - How to Build an "Instant" Atomic Force Microscope

Bill of Materials Controllers: MadPLL®controller and Nano-Drive® nanopositioning controller with open loop/close loop switch (OCL) option. Z fine motion: Nano-OP30 30μm range piezo stage with internal PicoQ® position sensor technology and sub-nanometer resolution. XY fine motion: Nano-SPM200 two axis, 200μm range of travel, closed-loop nanopositioner with internal PicoQ® position sensor technology and sub-nanometer resolution. XY and Z coarse motion: standard stages available from optical component suppliers. Sensor Amplifier and Probe Board: part of the MadPLL® package. Probe: Akiyama probe. Hardware: standard optical mounting fixtures. Akiyama probe PC (32 bit or 64 bit Windows XP/Vista/7 compatible) This configuration is a highly flexible multi-axis closed loop AFM. All Mad City Labs nanopositioning systems have low noise PicoQ® sensors and closed loop feedback control. Using MadPLL® the user can create a high performance scanning probe instrument at low cost. Additional options available from Mad City Labs Quartz Crystal Tuning Forks AFMView software Other configurations of 3 axis closed loop nanopositioners*    (e.g. Nano-HS3 Series, Nano-OP30 (Z), Nano-H Series (XY)) * All Mad City Labs nanopositioning systems include the Nano-Drive® controller which is fully LabVIEW/C++/MATLAB compatible. AFM configurations using a Nano-OP30 (Z-axis) and Nano-H100 (XY) typically achieve Z resolutions of 0.5nm (rms) and a scanning frequency of 1Hz. Higher resolutions and scan speeds can be achieved using different nanopositioner combinations. Recommended additional items Vibration isolation table Coarse Z-axis approach (manual or automated)

Seeing is Believing!

The images below were acquired using MadPLL^® with Mad City Labs closed loop nanopositioning systems.

	Calibration grid (100nm tall lines, 2µm apart) 10µm x 10µm Unidirectional scan Self oscillation mode, constant probe signal Z force feedback: frequency Data taken using MadPLL® with Nano-HS3 3-axis nanopositioning system.
	Calibration grid (100nm tall pegs, spaced 2µm apart) 10µm x 10µm Unidirectional scan Self oscillation mode, constant probe signal Z force feedback: frequency Data taken using MadPLL® with Nano-HS3 3-axis nanopositioning system.
	Fly eye 100µm x 100µm Bidirectional scan PLL mode, constant probe signal Z force feedback: frequency Data taken using MadPLL® with Nano-OP30 nanopositioning system (Z-axis), Nano-OP100 nanopositioning system (XY axes)
	Human hair 100µm x 100µm Bidirectional scan Self oscillation mode, constant probe signal Z force feedback: frequency Data taken using MadPLL® with Nano-OP30 nanopositioning system (Z-axis), Nano-OP100 nanopositioning system (XY axes)
	PMMA pattern, uncured 10 µm x 10 µm Bidirectional scan Self oscillation mode, constant probe signal Z force feedback: frequency Data taken using MadPLL® with Nano-OP30 nanopositioning system (Z-axis), Nano-OP100 nanopositioning system (XY axes)
	Integrated circuit 100 µm x 100 µm Bidirectional scan Self oscillation mode, constant probe signal Z force feedback: frequency Data taken using MadPLL® with Nano-OP30 nanopositioning system (Z-zxis), Nano-OP100 nanopositioning system (XY axes)
	Calibration grid 40 µm x 40 µm Unidirectional scan Self oscillation mode, constant probe signal Z force feedback: frequency Data taken using MadPLL® with Nano-OP30 nanopositioning system (Z-zxis), Nano-OP100 nanopositioning system (XY axes)
	Calibration grid (100nm tall, 10µm pitch) 70 µm x 70 µm Unidirectional scan PLL mode, constant probe signal Z force feedback: frequency Data taken using MadPLL® with Nano-OP30 nanopositioning system (Z-axis), Nano-OP100 nanopositioning system (XY axes)
	Etched structures 80 µm x 80 µm Bidirectional scan Self oscillation mode, constant probe signal Z force feedback: frequency Data taken using MadPLL® with Nano-OP30 nanopositioning system (Z-axis), Nano-OP100 nanopositioning system (XY axes)

Lock-In Amplifier
Phase Shifter	0° to 360°
Demodulation Bandwidth	3 kHz

Phase Lock Loop
Auto Range Selection	YES
Measurement Range	± 500 Hz
Measurement Resolution	50 mHz

Preamplifier
Input Gain (Attenuator)	0x to 1x (16 bit internal DAC)
Parasitic Capacitance Compensation (PCC)	YES
Automatic PCC	YES

Probe Oscillation Loop
Operating Modes	self oscillation PLL driven lock-in/DDS driven
Amplitude Control Modes	constant excitation constant signal
Amplitude Setpoint	16 bit internal DAC
Amplitude Control	YES, adjustable PI loop filter
Input Voltage Range	±10 V(peak)
Input Voltage Gain	2x to 40x
Frequency Range	10 kHz to 100 kHz
Output Voltage Range	±10 V(peak)

PI Loop Filter (Z-Axis)
Integration Time Constant	digitally controlled
Digitally Set Parameters	YES
Error Signal Inversion Capability	YES
Sensor Signals	frequency phase excitation amplitude signal amplitude
Command Signal	16 bit internal DAC
Automatic Loop Filter Setup	Yes, after initialization
Loop Output	0 to 14V

General
Spectrum Analysis	amplitude, phase
Feedback Monitor BNC	frequency phase excitation amplitude signal amplitude
Probe Signal Monitor (BNC)	sinewave amplitude probe (diagnostic)
Power Supply	90 to 260 VAC (50/60 Hz)
Controller Dimensions	16.75" x 14" x 1.75" (1U) (42.55cm x 35.56cm x 4.45cm)
PC Connection	USB
Operating System	32 bit: Windows 2000/XP Pro/Vista/7 64 bit: Windows XP Pro/Vista/7
LabVIEW Software OS	32 bit: Windows 2000/XP Pro/Vista/7 64bit: Windows XP Pro/Vista/7