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AFM Video Tutorial

Related Products
MadPLL®
Tuning Forks
Nano-OP Series
Nano-OPH Series
Nano-P Series
Nano-SPMZ
Nano-LR200
Nano-CZ200
Nano-CZ500
Nano-HSZ
Nano-MZ
Nano-Bio Series
Nano-H Series
Nano-PDQ Series
Nano-T Series
Nano-HS Series
Nano-F Series
Nano-M250
Nano-SPM200
Nano-LPQ
Nano-LP Series
Nano-M350

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AFM Video Tutorial

Watch our video on building an "instant" AFM. See how easy it is to assemble a low cost, high performance, closed loop AFM using the MadPLL® instrument package and Mad City Labs high resolution nanopositioning systems.

MadPLL® is a powerful instrument package that allows the user to create an inexpensive, high resolution resonant scanning probe microscope using Mad City Labs nanopositioning systems. In short, MadPLL® can be used to create an “instant” closed loop AFM or NSOM at a fraction of the cost of commercial systems with a flexibility that cannot be achieved with other commercial systems. A scanning probe microscope built with MadPLL® and Mad City Labs nanopositioning systems is suitable for nanoscale characterization and nanoscale fabrication applications such as optical antennas, nano-optics, semiconductors, data storage, and more.

The seamless integration of hardware combined with the built-in automated control of MadPLL® means that you can concentrate on getting results, not tweaking parameters. A scanning probe microscope built with MadPLL® and Mad City Labs nanopositioning systems is ideal for research and teaching laboratories offering high performance, versatility, simplicity and excellent value.


Part 1: AFM Instrument Assembly
Part 1: AFM Instrument Assembly


Nano-OP30 nanopositioning stage

  Components used in Part 1: AFM Instrument Assembly


  • Controllers: MadPLL® PLL controller and Nano-Drive® nanopositioning controller with open loop/close loop switch (OCL) option.
  • Z fine motion: Nano-OP30 30μm range piezo stage with internal PicoQ® position sensor technology and sub-nanometer resolution.
  • XY fine motion: Nano-SPM200 two axis, 200μm range of travel, closed-loop nanopositioner with internal PicoQ® position sensor technology and sub-nanometer resolution.
  • XY and Z coarse motion: standard stages available from optical component suppliers.
  • Sensor Amplifier and Probe Board: part of the MadPLL® package.
  • Probe: Akiyama probe.
  • Hardware: standard optical mounting fixtures.

  Recommended Products for Scanning Probe Microscopy

Product Description Axes Applications
MadPLL® Instrument Package
 Software, PLL controller, sensor amplifier, and probe boards
1
build an "instant" SPM, AFM, or NSOM with the MadPLL® package and Mad City Labs nanopositioners
Quartz Crystal Tuning Forks
 low cost, small quantity, ready-to-use, small or medium size
-
SPM, AFM, or NSOM probes
Nano-OP Series
 Ranges of motion from 30 µm up to 100 µm and can be combined to provide multi-axis motion
1
AFM, NSOM, interferometry, optical fiber positioning
Nano-OPH Series Large central aperture, ranges of motion from 30 µm up to 100 µm
1
nanomanipulation, AFM, NSOM, specialized microscopy
Nano-P Series Precision linear translator in a small cylindrical configuration with 15 µm, 35 µm or 70 µm of motion
1
metrology, AFM, NSOM, SPM, nanoindenting
Nano-SPMZ Single axis micropositioning and high resolution nanopositioning in a compact unit
1
nanoindenting, nanomanipulation, SPM, AFM, NSOM
Nano-LR200 200 µm of motion combined with exceptionally low out-of-plane motion for special applications
1
AFM, SPM, NSOM, wafer profilometry, optical alignment
Nano-CZ200 Compact, long range (200 µm) precision nanopositioning system 1 (Z) metrology, high precision optical alignment and mirror positioning, scanning probe microscopy
Nano-CZ500 Compact, super long range (500 µm) precision nanopositioning system 1 (Z) high resolution probe scanning, metrology, optical alignment and mirror positioning
Nano-HSZ High speednanopositioner with picometer precision 1 (Z) high speed AFM, NSOM, SPM, optical alignment and miror positioning
Nano-MZ Compact with 25 µm range of motion 1 (Z) AFM, optical aligment, metrology
Nano-Bio Series Low profile, with large aperture for use with inverted optical microscopes, available in 50 µm, 100 µm, and 200 µm ranges of motion 2 optical microscopy, AFM scanning, super resolution (SR) microscopy
Nano-H Series Compact, long range stage with a large aperture 2 optical microscopy, AFM scanning, fluorescence imaging, optical tweezers
Nano-PDQ Series Extremely high speed nanopositioners with a large center aperture, up to 75 µm of motion in XY, and 50 µm of motion in Z 2 or 3 optical trapping, optical tweezers, high speed particle tracking, AFM, NSOM
Nano-T Series Economical systems with sub-nanometer resolution 2 or 3 fluorescence imaging, super resolution (SR) microscopy, AFM scanning
Nano-HS Series High speed nanopositioning system with picometer positioning resolution 2 or 3 high speed AFM, SPM, metrology
Nano-M250 Compact system constructed from titanium or invar with a 0.5 inch aperture 2 nanolithography, SEM, AFM
Nano-SPM200 Compact nanopositioning system with 200µm travel 2 AFM, NSOM, SPM, nanofabrication
Nano-LPQ
 Ultra-low profile, high speed nanopositioning system with 75 microns of travel in XY and 50 microns in Z 3 optical trapping, optical tweezers, high speed particle tracking, NSOM, SPM
Nano-LP Series Low profile with 100µm, 200 µm or 300 µm in X, Y and Z. 3 single molecule microscopy and spectroscopy, AFM scanning, fluorescence imaging, super resolution (SR) microscopy
Nano-M350 Compact, constructed from titanium and aluminum with a 0.25 inch aperture 3 nanolithography,SEM, MEMS testing, alignment, AFM



Additional Information

MadPLL® Brochure
Laser Focus World Article

NANOPOSITIONING: Piezo­electric nano­positioners forge low-cost atomic force microscope

mclgen@madcitylabs.com       phone: 608.298.0855       fax: 608.298.9525

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