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Nanopositioners
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>>Nano-LP Series

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Drawing
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Features
  • Lowest profile 3-axis nanopositioner available
  • Large aperture
  • 100 μm, 200 μm, and 300 μm ranges of motion (XYZ)
  • Closed loop control
  • High stability


Typical Applications
  • Optical microscopy, easy to retrofit
  • Optical trapping experiments
  • Fluorescence imaging
  • Alignment
  • Single molecule spectroscopy
  • Super resolution microscopy



Product Description

The Nano-LP Series are ultra-low profile, three axis nanopositioning systems with 100, 200, and 300 micron ranges of motion in all three axes. The low height of the Nano-LP Series allows it to be easily integrated into existing inverted optical microscopes. With its extended ranges of motion, the Nano-LP Series is ideal for demanding microscopy applications which require long range travel, fast scan rates, and three axes of motion. The Nano-LP Series’ internal position sensors utilize proprietary PicoQ® technology to provide absolute, repeatable position measurement with picometer accuracy under closed loop control. See the Nano-Bio Series for a low-profile, 2-axis nanopositioning system.

Compatible Software Packages:
      


Technical Specifications

Range of motion (Nano-LP100) 100 x 100 x 100 μm
Range of motion (Nano-LP200)
200 x 200 x 200 μm
Range of motion (Nano-LP300) 300 x 300 x 300 μm
Resolution (100/200/300 μm) 0.2/0.4/0.6 nm
Resonant Frequencies  
X axis (100/200/300 μm) 450/400/350 Hz ±20%
Y axis (100/200/300 μm) 350/300/250 Hz ±20%
Z axis (100/200/300 μm) 450/350/250 Hz ±20%
Stiffness 1.0 N/μm
θ roll, θ pitch (typical) ≤1 μrad
θ yaw (typical) ≤3 μrad
Recommended max. load (horizontal)* 0.5 kg
Recommended max. load (vertical)* 0.2 kg
Body Material Al (all models), Invar or Titanium (100 or 200μm only)
Controller Nano-Drive®
* Larger load requirements should be discussed with our engineering staff.


Nano-LP200 Position Noise Spectrum



AFM Verification of PicoQ® Sensor Technology Performance


A nanopositioner's inherent position noise must be very small in order for it to perform externally-detectable sub-nanometer motion. The AFM measurement below uses a Nano-LP100 and is one of many tests confirming that Mad City Labs nanopositioners with PicoQ® sensor technology set the standard for the lowest position noise on the market.

Position noise of a nanopositioning system is the ultimate limit of the system's measurement resolution. Many applications involving sub-nanometer measurements, such as atomic force microscopy (AFM), would not be possible without low noise nanopositioning systems. Some companies claim to sell systems with sub-nanometer resolution, but they do not have data from external metrology tests to support their claims. All Mad City Labs nanopositioning products are rigorously tested before shipment. These tests involve a series of measurements designed to fully characterize the performance of the nanopositioning system with a realistic environment and testing conditions that match the application. Available metrology tools include NIST-traceable interferometers, high resolution AFM, and a high resolution position noise analyzer, designed specifically for nanopositioning characterization. The links below lead to in-depth descriptions of some of our AFM measurements.

95pm step performed by Nano-LP100 and measured by Mad City Labs AFM
Nano-LP100 Z axis performing repeated 95 pm steps, measured externally by AFM.
Nano-LP Series Demonstrations: Sub-Nanometer Motion
Nano-LP100 and 450 micron range nanopositioner with PicoQ sensor technology perform 860 picometer steps, 1 nanometer sine wave, and repeated 95 picometer steps, externally measured by AFM.

Nano-LP Series Demonstrations: Measuring Surface Roughness
AFM is used to externally verify that the position noise of a Nano-LP100 with PicoQ® sensor technology is less than the surface roughness of a Si (111) sample, 60 pm RMS.


Additional Information

Nano-LP Series Drawing

Nano-LP Series Catalog Pages


Related Products


mclgen@madcitylabs.com       phone: 608.298.0855       fax: 608.298.9525

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