Manual MicroStage-LT Series
- Lowest profile 3-axis nanopositioner available
- Large aperture
- 100 μm, 200 μm, and 300 μm ranges of motion (XYZ)
- Closed loop control
- High stability
- Optical microscopy, easy to retrofit
- Optical trapping experiments
- Fluorescence imaging
- Single molecule spectroscopy
- Super resolution microscopy
The Nano-LP Series are ultra-low profile, three axis
nanopositioning systems with 100, 200, and 300 micron
ranges of motion in all three axes. The low height of
the Nano-LP Series allows it to be easily integrated into
existing inverted optical microscopes. With its extended
ranges of motion, the Nano-LP Series is ideal for demanding microscopy applications which require long
range travel, fast scan rates, and three axes of motion.
The Nano-LP Series’ internal position sensors utilize
proprietary PicoQ® technology to provide absolute, repeatable
position measurement with picometer accuracy
under closed loop control. See the Nano-Bio Series for a low-profile, 2-axis nanopositioning system.
Compatible Software Packages:
|Range of motion (Nano-LP100)
||100 x 100 x 100 μm
|Range of motion (Nano-LP200)
|200 x 200 x 200 μm
|Range of motion (Nano-LP300)
||300 x 300 x 300 μm
|Resolution (100/200/300 μm)
|X axis (100/200/300 μm)
||450/400/350 Hz ±20%
|Y axis (100/200/300 μm)
||350/300/250 Hz ±20%
|Z axis (100/200/300 μm)
||450/350/250 Hz ±20%
|θ roll, θ pitch (typical)
|θ yaw (typical)
|Recommended max. load (horizontal)*
|Recommended max. load (vertical)*
||Al (all models), Invar or Titanium (100 or 200μm only)
|* Larger load requirements should be discussed with our engineering staff.
Nano-LP200 Position Noise Spectrum
AFM Verification of PicoQ® Sensor Technology Performance
A nanopositioner's inherent position noise must be very small in order for it to perform externally-detectable sub-nanometer motion. The AFM measurement below uses a Nano-LP100 and is one of many tests confirming that Mad City Labs nanopositioners with PicoQ® sensor technology set the standard for the lowest position noise on the market.
Position noise of a nanopositioning system is the ultimate limit of the system's measurement resolution. Many applications involving sub-nanometer measurements, such as atomic force microscopy (AFM), would not be possible without low noise nanopositioning systems. Some companies claim to sell systems with sub-nanometer resolution, but they do not have data from external metrology tests to support their claims. All Mad City Labs nanopositioning products are rigorously tested before shipment. These tests involve a series of measurements designed to fully characterize the performance of the nanopositioning system with a realistic environment and testing conditions that match the application. Available metrology tools include NIST-traceable interferometers, high resolution AFM, and a high resolution position noise analyzer, designed specifically for nanopositioning characterization. The links below lead to in-depth descriptions of some of our AFM measurements.
Nano-LP Series Demonstrations: Sub-Nanometer Motion
Nano-LP100 and 450 micron range nanopositioner with PicoQ sensor technology perform 860 picometer steps, 1 nanometer sine wave, and repeated 95 picometer steps, externally measured by AFM.
Nano-LP Series Demonstrations: Measuring Surface Roughness
AFM is used to externally verify that the position noise of a Nano-LP100 with PicoQ® sensor technology is less than the surface roughness of a Si (111) sample, 60 pm RMS.