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Nanopositioners
>>Nano-HS Series

Additinal Information
Drawing (HS2)
Drawing (HS3)
Catalog Pages

Related Products
Nano-HS3M
Nano-HSZ
MMP Series
Nano-LPQ
Nano-PDQ Series
Nano-Man5
Nano-M350
Nano-MZ
Nano-3D200
Accessories
SPM Accessories
Nano-Drive®
MadPLL®
SPM-M Kit®

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Features
  • High speed, multi-axis piezo nanopositioner
  • XY and XYZ configurations
  • Z-axis step response time down to 2ms
  • Z-axis scans up to 300 Hz
  • Closed loop control
  • Picometer positioning resolution
  • High stability


Typical Applications
  • High speed, high resolution positioning
  • Metrology
  • AFM
  • SPM



Product Description

The Nano-HS Series is a high speed, multi-axis, precision piezo nanopositioning system with picometer positioning resolution. Offering maximum versatility, the Nano-HS can be configured to provide XY or XYZ motion. Internal position sensors utilizing proprietary PicoQ® technology provide absolute, repeatable position measurement under closed loop control. The compact footprint, ultra-low noise characteristics, and a Z-axis resonant frequency of 5kHz make it ideal for metrology applications that require noise floors less than 10 picometers and/or high speed performance. The Nano-HS2 is an ideal high speed XY scanning stage for use with the MadPLL® system. See the SPM-M Kit for an example of how to combine Mad City Labs equipment to build an AFM or NSOM. For an XYZ system with even higher speed Z, see the Nano-HS3M.



Technical Specifications

Range of motion (XYZ) 10 μm
Resolution
0.01 nm
XY (HS2) Resonant Frequency 1.5 kHz ±20%
XY (HS3) Resonant Frequency 1.0 kHz ±20%
Z (HS3) Resonant Frequency 5.0 kHz ±20%
Scanning Speed up to 300 Hz
Stiffness (Z-axis) 8 N/μm
Recommended max. load (horizontal)* 0.1 kg
Recommended max. load (vertical)* 0.1 kg
Body Material Al, Invar or Titanium
Controller Nano-Drive®
* Larger load requirements should be discussed with our engineering staff.


Position Noise Spectrum

The Nano-HS Series demonstrates less than 2 picometers of position noise on all three axes. Click below to enlarge and view the data for each axis.



AFM Verification of PicoQ® Sensor Technology Performance


Position noise of a piezo nanopositioning system is the ultimate limit of the system's measurement resolution. Many applications involving sub-nanometer measurements, such as atomic force microscopy (AFM), would not be possible without low noise nanopositioning systems. The tests below employ a Nano-HS3 for XYZ probe motion and demonstrate the ultra-low position noise and high accuracy of nanopositioning systems with PicoQ® sensor technology.

Some companies claim to sell systems with sub-nanometer resolution, but they do not have data from external metrology tests to support their claims. All Mad City Labs piezo nanopositioning products are rigorously tested before shipment. These tests involve a series of measurements designed to fully characterize the performance of the nanopositioning system with a realistic environment and testing conditions that match the application. Available metrology tools include NIST-traceable interferometers, high resolution AFM, and a high resolution position noise analyzer, designed specifically for nanopositioning characterization. The links below lead to in-depth descriptions of some of our AFM measurements.

2D representation of 312 pm Si (111) atomic steps measured by AFM
312 pm Si (111) atomic steps detected using the Nano-HS3 with PicoQ® sensor technology, measured by AFM.
AFM Demonstrations: Measuring Atomic Steps
Measurements taken with an AFM show that piezo nanopositioners with PicoQ® sensor technology have sufficiently low position noise to accurately resolve single atomic layer size steps, 312 pm.

AFM Demonstrations: Sub-Nanometer Motion
100 and 450 micron range nanopositioners with PicoQ sensor technology perform 860 picometer steps, 1 nanometer sine wave, and repeated 95 picometer steps, externally measured by AFM.

AFM Demonstrations: Measuring Surface Roughness
AFM is used to externally verify that the position noise of a piezo nanopositioning system with PicoQ® sensor technology is less than the surface roughness of a Si (111) sample, 60 pm RMS.


Additional Information

Nano-HS2 Drawing


Nano-HS3 Drawing

Nano-HS Series Catalog Pages


Related Products



mclgen@madcitylabs.com       phone: 608.298.0855       fax: 608.298.9525

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