>>QS-PLL®
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Features
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Typical Applications
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Product Description |
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The QS-PLL® controller enables users to create customizable scanning probe microscopes. The QS-PLL® controller with included AFMView®2 software works seamlessly with Mad City Labs nanopositioning and micropositioning systems. The integrated approach means that users can build atomic force microscopy (AFM) platforms with very little engineering overhead, saving time and money.The QS-PLL® has been specifically designed for resonant probes up to 100kHz such as tuning forks, Akiyama, Qzabre and Qnami probes. The QS-PLL® controller includes a high resolution digital phase lock loop (PLL) controller, integrated positioning control, AFMView®2 positioning control and AFM data acquisition software, sensor amplifier, and resonant probe mounting boards. The integrated positioning control includes a proportional integral (PI) loop designed to work seamlessly with Mad City Labs high resolution nanopositioning systems, which optimizes the performance. The QS-PLL® contains a DSP data acquisition system and multiple microprocessors to support the DSP functions. AFMView®2 software communicates with the DSP via the USB interface to facilitate the device control and the AFM data acquisition. AFMView®2 software controls and optimizes the connected hardward devices for AFM experiments. It also enables the experiment workflow and data acquisition. The software includes automated features to simplify device setup and data acquisition, however for more complex experiments, users retain the ability to manually optimize critical parameters of the QS-PLL® as needed. The software enables three scan types; Surface, Lift, Constant Z (height); automated setup and intiialization, direct data export to Gwyddion and MountainsSPIP®, auto-calibration of nanopositioning devices, acquisition timing control, and external device control via TTL pulses. Applications for the QS-PLL® include Quantum Scanning Magnetometry, Near-field Scanning Optical Microscopy (NSOM/SNOM), Magnetic Force Microscopy, Electric Force Microscopy, Thermoreflectance Microscopy, Tip-Enhanced Raman Spectroscopy (TERS), and Terahertz imaging. |
Technical Specifications |
Motion Control |
| Closed Loop Nanopositioners | 1-3 axis |
| Position DAC Control |
20 Bit |
| Position ADC |
24 Bit |
| Number of Micropositioners | 1-4 axis |
| Micropositioner minimum step size | 95 nm |
| Encoders | 1-3 axis |
| Encoder Resolution | 50 nm |
| Phase Locked Loop Control | Digital |
I/O Connectors |
| Nanopositioners | DB-37 |
| Micropositioners | DB-50 |
| Sensor Amplifier | DB-9 |
| Feedback Monitor | 1 x BNC |
| Probe Monitor | 1 x BNC |
| 24 bit ADC Input | -10V to +10V (2 x BNC) |
| 16 bit ADC input | 0V to +10V (2 x BNC) |
| 16 bit DAC output | -10V to +10V |
| Z Loop Out | 0V to +14V (BNC) |
| Pixel Clock | TTL (out) |
| Line Clock | TTL (out) |
| Frame Clock | TTL (out) |
| External Clock | TTL(in) |
PLL Features |
| Feedback Modes | Amplitude/Frequency/Phase Shift |
| Automatic Range Selection | YES |
| Parasitic Capacitance Compensation (PCC) | YES |
| Automatic PCC | YES |
| Adjustable PI loop filter | YES |
| Digitally Set Parameters | YES |
| Error Signal Inversion Capability | YES |
| Automatic Loop Filter Setup | YES, after initialization |
| Frequency Range | 10 kHz - 100 kHz |
AFMView®2 Software |
| Supported Devices | Mad City Labs Nanopositioning systems, Micropositioning Systems, and PLL controllers |
| Supported Scan Types | Surface, Lift, Constant Z |
| Automated Functions | Hardware configuration, QS-PLL® parameters, Probe characterization, Nanopositioner calibration, Probe optimization, Probe approach |
| Direct Data Export | Gwyddion, MountainsSPIP® |
General |
| AC Power | 90 - 260 (50/60 Hz) |
| Controller Dimensions | 16.75" x 14" x 3.5" (42.6 cm x 35.6 cm x 8.9 cm) |
| Breakout Box Dimensions | 8.375" x 8" x8.9" (21.3 cm x 20.3 cm x 8.9 cm) |
| PC Connection | USB 2.0 |
| Operating System | Windows 10/11 |
| Included Accessories | Probe Boards, Test Kit |
| Other Accessories | Specialty Probe Boards, Probe Starter Kit, SPM Etch Kit, Tuning Forks |
AFM Verification using the QS-PLL®.
Image of SiC stepped surface taken with an AFM incorporating the QS-PLL and AFMView®2 software. The measurement was made using an etched W tip attached to a tuning fork . The AFM used a custom Nano-3D200 with 200 x 200 um scan range and 20 um of Z motion. The system was set up as a sample scanner with a tuning fork sensor mounted to a three axis micropositioner. The X and Y axis of the micropositioner was manual while the Z axis was motorized. |
Additional Information | |
QS-PLL® Brochure
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